b1b33-05 JAGUAR XFR 2010 1.G Workshop Manual

DTC Description Possible Causes Action default key
transponder key operation. Ensure new keys are
from a known source B1B01-55
Key Transponder - Not
configured
Un-programmed key
inserted in SCU2
A non default key inserted
during key programming
Confirm the correct keys are used B1B01-62
Key Transponder -
Signal compare failure
Instrument cluster power
and ground supply circuits -
short, open circuit
Smartcard docking station
power and ground supply
circuits - short, open circuit
Incorrect instrument cluster
or smartcard docking station
installed
Error during or following the
Write Target SID routine
Noise/EMC related error
Carry out any pinpoint tests associated with this
DTC using the manufacturer approved diagnostic
system. Refer to the electrical circuit diagrams
and check smartcard docking station power and
ground supply circuits for short, open circuit and
instrument cluster power and ground supply
circuits for short, open circuit. Check correct
instrument cluster and smartcard docking station
are installed. Perform the Immobilisation
application from the Set-Up menu using the
manufacturer approved diagnostic system. Check
CAN network for interference/EMC related issues B1B01-64
Key Transponder -
Signal plausibility
failure
LIN fault
Instrument cluster power
and ground supply circuits -
short, open circuit
Transponder key fault
Smartcard docking station
power and ground supply
circuits - short, open circuit
Error occurred during
transponder key
programming
Carry out any pinpoint tests associated with this
DTC using the manufacturer approved diagnostic
system. Check LIN communications between
smartcard docking station and instrument
cluster. Refer to the electrical circuit diagrams
and check smartcard docking station power and
ground supply circuits for short, open circuit and
instrument cluster power and ground supply
circuits for short, open circuit. Confirm
transponder key operation. Repeat transponder
key programming B1B01-67
Key Transponder -
Signal incorrect after
event
LIN fault
Instrument cluster power
and ground supply circuits -
short, open circuit
Transponder key fault
Smartcard docking station
power and ground supply
circuits - short, open circuit
Another key in close
proximity
Instrument cluster in
incorrect programming state
Attempted to program a non
default key
Instrument cluster Cold init
whilst in Ignition On state,
without key being present in
the SCU
Race condition caused by
closing driver door and
pressing the start button
within a small time window
Passive Key search function
from last door closed and
key inserted in the SCU
Carry out any pinpoint tests associated with this
DTC using the manufacturer approved diagnostic
system. Check LIN communications between
smartcard docking station and instrument
cluster. Refer to the electrical circuit diagrams
and check smartcard docking station power and
ground supply circuits for short, open circuit and
instrument cluster power and ground supply
circuits for short, open circuit. Confirm
transponder key operation. Confirm single key
operation. Ensure instrument cluster in correct
mode i.e. Auto Enable, Key erase etc. Ensure
new keys are from a known source. Check for
intermittent power and ground to instrument
cluster. Design condition - advise customer of
starting sequence. Design condition - determine
customer transponder key usage B1B01-87
Key Transponder -
Missing message
LIN fault
Instrument cluster power
and ground supply circuits -
short, open circuit
Smartcard docking station
power and ground supply
circuits - short, open circuit
Carry out any pinpoint tests associated with this
DTC using the manufacturer approved diagnostic
system. Check LIN communications between
smartcard docking station and instrument
cluster. Refer to the electrical circuit diagrams
and check smartcard docking station power and
ground supply circuits for short, open circuit and
instrument cluster power and ground supply
circuits for short, open circuit B1B33-05 Target I.D. Transfer -
System programming
failures
CAN fault
ECM ignition, power and
ground supply circuits -
short, open circuit
Carry out any pinpoint tests associated with this
DTC using the manufacturer approved diagnostic
system. Check CAN communications between
ECM and instrument cluster. Refer to electrical